Dr. Aurelian Catalin Galca, received the Ph.D. Degree from University of Twente, Enschede, the Netherlands in 2006. Currently he is Senior Researcher rank I and responsible for international collaborations at National Institute of Materials Physics, Magurele, Romania.
His main scientific expertise is on non-destructive characterization (spectroscopic ellipsometry, X-ray diffraction, Raman Spectroscopy, ultraviolet-visible and infrared spectroscopy) of glasses, ceramics, single crystals, thin films and multilayers. He holds competence in preparation of films by various deposition methods, in the structural and optical characterization of thin films and multistructures for integration in film transistors, photovoltaic cells or memory storage units, as well as in the development and testing of above-mentioned electronic devices.
Awards: „Radu Grigorovici” Romanian Academy award for contributions made in optical characterization of oxide systems (2011).
Dr. Galca has a prestigious scientific activity valued through 136 articles and 3 US patents.
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